Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

    New search for: Yoshida, Y.
    New search for: Takiguchi, H.
    New search for: Hanada, T.
    New search for: Tanigaki, N.
    New search for: Mi Han, E.
    New search for: Yase, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

    New search for: Yoshida, Y.
    New search for: Takiguchi, H.
    New search for: Hanada, T.
    New search for: Tanigaki, N.
    New search for: Mi Han, E.
    New search for: Yase, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

    New search for: Yoshida, Y.
    New search for: Takiguchi, H.
    New search for: Hanada, T.
    New search for: Tanigaki, N.
    New search for: Mi Han, E.
    New search for: Yase, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

    Contributors:

    Yoshida, Y. (author) / Takiguchi, H. (author) / Hanada, T. (author) / Tanigaki, N. (author) / Mi Han, E. (author) / Yase, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 130-132 ; 651-657

    Publication date:

    1998-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films

    Koch, N. / Oji, H. / Ito, E. et al. | British Library Online Contents | 2001

    Aluminium nitride thin films prepared by ion beam assisted deposition method

    Watanabe, Y. | British Library Online Contents | 1998

    Organic Molecular Beam Deposition of Highly Oriented -Tetrahexylsexithiophene Films

    Borghesi, A. / Sassella, A. / Tubino, R. et al. | British Library Online Contents | 1998

    Electrochemical Characteristics of CrN Thin Films Prepared by Ion-Beam-Enhanced Deposition

    Mizuno, D. / Akao, N. / Hara, N. et al. | British Library Online Contents | 1999

    Microstructural characterization of Ti-C-N thin films prepared by reactive crossed beam pulsed laser deposition

    Escobar-Alarcon, L. / Medina, V. / Camps, E. et al. | British Library Online Contents | 2011

    Back to top