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Microstructural characterization of Ti-C-N thin films prepared by reactive crossed beam pulsed laser deposition
Microstructural characterization of Ti-C-N thin films prepared by reactive crossed beam pulsed laser deposition
Microstructural characterization of Ti-C-N thin films prepared by reactive crossed beam pulsed laser deposition
Escobar-Alarcon, L. (author) / Medina, V. (author) / Camps, E. (author) / Romero, S. (author) / Fernandez, M. (author) / Solis-Casados, D. (author)
APPLIED SURFACE SCIENCE ; 257 ; 9033-9037
2011-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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