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    Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data

    New search for: Lesiak, B.
    New search for: Zemek, J.
    New search for: Jozwik, A.

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    Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data

    New search for: Lesiak, B.
    New search for: Zemek, J.
    New search for: Jozwik, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data

    New search for: Lesiak, B.
    New search for: Zemek, J.
    New search for: Jozwik, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data

    Contributors:

    Lesiak, B. (author) / Zemek, J. (author) / Jozwik, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 135 ; 318-330

    Publication date:

    1998-01-01

    Size:

    13 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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