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Scanning probe microscopy for the imaging and control of ferroelectric oxides
Scanning probe microscopy for the imaging and control of ferroelectric oxides
Scanning probe microscopy for the imaging and control of ferroelectric oxides
Ahn, C. H. (author) / Tybell, T. (author) / Kuffer, O. (author) / Antognazza, L. (author) / Char, K. (author) / Hammond, R. H. (author) / Beasley, M. R. (author) / Fischer, O. (author) / Triscone, J.-M. (author) / Schlom, D. G.
1998-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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