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    Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

    New search for: Kawamoto, H.
    New search for: Miura, S.
    New search for: Yano, K.
    New search for: Ohkubo, K.
    New search for: Mohri, T.

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    Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

    New search for: Kawamoto, H.
    New search for: Miura, S.
    New search for: Yano, K.
    New search for: Ohkubo, K.
    New search for: Mohri, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

    New search for: Kawamoto, H.
    New search for: Miura, S.
    New search for: Yano, K.
    New search for: Ohkubo, K.
    New search for: Mohri, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Analysis of Strain Transfer through the Mg/Ti Interface Using Crystallographic Orientation Analysis Based on Electron Back-Scattered Diffraction Patterns

    Contributors:

    Kawamoto, H. (author) / Miura, S. (author) / Yano, K. (author) / Ohkubo, K. (author) / Mohri, T. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 49 ; 1107-1111

    Publication date:

    2008-01-01

    Size:

    5 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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