The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal: Fid-Bau Portal

The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Kato, T. / Ohsato, H. / Okamoto, A. / Sugiyama, N. / Okuda, T.

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The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Kato, T. / Ohsato, H. / Okamoto, A. / Sugiyama, N. / Okuda, T.

The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Kato, T. / Ohsato, H. / Okamoto, A. / Sugiyama, N. / Okuda, T.

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Check availability in my library

Order at Subito €

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Document information

Title:

The photoelastic constant and internal stress around micropipe defects of 6H-SiC single crystal

Contributors:

Kato, T. (author) / Ohsato, H. (author) / Okamoto, A. (author) / Sugiyama, N. (author) / Okuda, T. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 57 ; 147-149

Publication date:

1999-01-01

Size:

3 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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