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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, F. J. / Bielefeldt, H. / Hembacher, S. / Mannhart, J.

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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, F. J. / Bielefeldt, H. / Hembacher, S. / Mannhart, J.

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, F. J. / Bielefeldt, H. / Hembacher, S. / Mannhart, J.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Contributors:

Giessibl, F. J. (author) / Bielefeldt, H. (author) / Hembacher, S. (author) / Mannhart, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 140 ; 352-357

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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