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    Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

    New search for: Kelley, T. W.
    New search for: Granstrom, E. L.
    New search for: Frisbie, C. D.

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    Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

    New search for: Kelley, T. W.
    New search for: Granstrom, E. L.
    New search for: Frisbie, C. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

    New search for: Kelley, T. W.
    New search for: Granstrom, E. L.
    New search for: Frisbie, C. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

    Contributors:

    Kelley, T. W. (author) / Granstrom, E. L. (author) / Frisbie, C. D. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH- ; 11 ; 261-264

    Publication date:

    1999-01-01

    Size:

    4 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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