Kelvin probe force microscopy using near-field optical tips

Shikler, R. / Rosenwaks, Y. | British Library Online Contents | 2000

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Glatzel, T. / Sadewasser, S. / Lux-Steiner, M. C. | British Library Online Contents | 2003

Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

Krok, F. / Kolodziej, J. / Such, B. et al. | British Library Online Contents | 2003

Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Palermo, V. / Palma, M. / Samori, P. | British Library Online Contents | 2006

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Kondratenko, S.V. / Lysenko, V.S. / Kozyrev, Yu. N. et al. | British Library Online Contents | 2016