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    Damage mechanics of electromigration induced failure

    New search for: Basaran, C.
    New search for: Lin, M.

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    Damage mechanics of electromigration induced failure

    New search for: Basaran, C.
    New search for: Lin, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Damage mechanics of electromigration induced failure

    New search for: Basaran, C.
    New search for: Lin, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Damage mechanics of electromigration induced failure

    Contributors:

    Basaran, C. (author) / Lin, M. (author)

    Published in:

    MECHANICS OF MATERIALS ; 40 ; 66-79

    Publication date:

    2008-01-01

    Size:

    14 pages

    ISSN:

    0167-6636

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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