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    Electromigration - A material transport phenomenum in microelectronic circuits

    New search for: Roth, W.
    New search for: Eden, K.

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    Electromigration - A material transport phenomenum in microelectronic circuits

    New search for: Roth, W.
    New search for: Eden, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electromigration - A material transport phenomenum in microelectronic circuits

    New search for: Roth, W.
    New search for: Eden, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Electromigration - A material transport phenomenum in microelectronic circuits

    Contributors:

    Roth, W. (author) / Eden, K. (author)

    Published in:

    WERKSTOFFE UND KORROSION -WEINHEIM- ; 44 ; 130

    Publication date:

    1993-01-01

    Size:

    130 pages

    ISSN:

    0043-2822

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11223

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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