Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling: Fid-Bau Portal

Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Dufrene, Y.F. / Marchal, T.G. / Rouxhet, P.G.

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Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Dufrene, Y.F. / Marchal, T.G. / Rouxhet, P.G.

Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Dufrene, Y.F. / Marchal, T.G. / Rouxhet, P.G.

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Check availability in my library

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Document information

Title:

Probing the organization of adsorbed protein layers: complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Contributors:

Dufrene, Y.F. (author) / Marchal, T.G. (author) / Rouxhet, P.G. (author)

Published in:

APPLIED SURFACE SCIENCE ; 144 ; 638-643

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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