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    Improved Depthwise Resolution in Secondary-Ion Mass Spectrometry Using Proton Beams

    New search for: Vasil'ev, M. A.
    New search for: Makeeva, I. N.

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    Improved Depthwise Resolution in Secondary-Ion Mass Spectrometry Using Proton Beams

    New search for: Vasil'ev, M. A.
    New search for: Makeeva, I. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Improved Depthwise Resolution in Secondary-Ion Mass Spectrometry Using Proton Beams

    New search for: Vasil'ev, M. A.
    New search for: Makeeva, I. N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Improved Depthwise Resolution in Secondary-Ion Mass Spectrometry Using Proton Beams

    Contributors:

    Vasil'ev, M. A. (author) / Makeeva, I. N. (author)

    Published in:

    INDUSTRIAL LABORATORY C/C OF ZAVODSKAIA LABORATORIIA ; 64 ; 576-578

    Publication date:

    1998-01-01

    Size:

    3 pages

    ISSN:

    0019-8447

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  607.2

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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