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Defect-induced microstructures: an X-ray diffraction analysis

Chrosch, J. / Colombo, M. / Memmi, I. / Biagini, R.

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Defect-induced microstructures: an X-ray diffraction analysis

Chrosch, J. / Colombo, M. / Memmi, I. / Biagini, R.

Defect-induced microstructures: an X-ray diffraction analysis

Chrosch, J. / Colombo, M. / Memmi, I. / Biagini, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Defect-induced microstructures: an X-ray diffraction analysis

Contributors:

Chrosch, J. (author) / Colombo, M. (author) / Memmi, I. (author) / Biagini, R. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 34 ; 2263-2268

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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