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X-Ray Diffraction from Multilayers with Different Microstructures

He, P. / Woollam, J. A. / Sequeda, F. O.

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X-Ray Diffraction from Multilayers with Different Microstructures

He, P. / Woollam, J. A. / Sequeda, F. O.

X-Ray Diffraction from Multilayers with Different Microstructures

He, P. / Woollam, J. A. / Sequeda, F. O.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

X-Ray Diffraction from Multilayers with Different Microstructures

Contributors:

He, P. (author) / Woollam, J. A. (author) / Sequeda, F. O. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 185

Publication date:

1993-01-01

Size:

185 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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