Dependence of the structural and optical properties of Si~xGe~1~-~x/Si heterostructures on the Si substrate temperature and the Ge mole fraction: Fid-Bau Portal

Dependence of the structural and optical properties of Si~xGe~1~-~x/Si heterostructures on the Si substrate temperature and the Ge mole fraction

Woo, Y. D. / Kang, T. W. / Kim, T. W.

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Dependence of the structural and optical properties of Si~xGe~1~-~x/Si heterostructures on the Si substrate temperature and the Ge mole fraction

Woo, Y. D. / Kang, T. W. / Kim, T. W.

Dependence of the structural and optical properties of Si~xGe~1~-~x/Si heterostructures on the Si substrate temperature and the Ge mole fraction

Woo, Y. D. / Kang, T. W. / Kim, T. W.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Dependence of the structural and optical properties of Si~xGe~1~-~x/Si heterostructures on the Si substrate temperature and the Ge mole fraction

Contributors:

Woo, Y. D. (author) / Kang, T. W. (author) / Kim, T. W. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 18 ; 435-438

Publication date:

1999-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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