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    Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry

    New search for: Zangooie, S.
    New search for: Jansson, R.
    New search for: Arwin, H.

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    Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry

    New search for: Zangooie, S.
    New search for: Jansson, R.
    New search for: Arwin, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry

    New search for: Zangooie, S.
    New search for: Jansson, R.
    New search for: Arwin, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry

    Contributors:

    Zangooie, S. (author) / Jansson, R. (author) / Arwin, H. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 4167-4175

    Publication date:

    1999-01-01

    Size:

    9 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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