A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
High resolution lifetime scan maps of silicon wafers
High resolution lifetime scan maps of silicon wafers
High resolution lifetime scan maps of silicon wafers
Palais, O. (author) / Gervais, J. (author) / Clerc, L. (author) / Martinuzzi, S. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 47 - 50
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers
| British Library Online Contents | 2002
Lifetime improvement in silicon wafers using weak magnetic fields
| British Library Online Contents | 2017
Minority carrier lifetime and metallic-impurity mapping in silicon wafers
| British Library Online Contents | 2001
Mapping of minority carrier lifetime and mobility in imperfect silicon wafers
| British Library Online Contents | 2003
Lifetime Identification of Thermal Oxidation Process Induced Contamination in Silicon Wafers
| British Library Online Contents | 1995