Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

Palais, O. / Yakimov, E. / Martinuzzi, S. | British Library Online Contents | 2002

Lifetime improvement in silicon wafers using weak magnetic fields

Kuryliuk, A. / Steblenko, L. / Nadtochiy, A. et al. | British Library Online Contents | 2017

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

Lifetime Identification of Thermal Oxidation Process Induced Contamination in Silicon Wafers

Daio, H. / Yakushiji, K. / Buczkowski, A. et al. | British Library Online Contents | 1995