Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. et al. | British Library Online Contents | 2000

A large angle convergent beam electron diffraction study of the core nature of dislocations in 3C-SiC

Ning, X. J. / Pirouz, P. | British Library Online Contents | 1996

Strain distribution around a NiSi~2/Si interface measured by convergent beam electron diffraction

Wakayama, Y. / Tanaka, S.-I. | British Library Online Contents | 1997

Internal stress measurements by convergent beam electron diffraction on creep-deformed Al single crystals

Kassner, M. E. / Perez-Prado, M. T. / Vecchio, K. S. | British Library Online Contents | 2001

Application of the large angle convergent beam electron diffraction technique to the characterisation of martensitic phases in Cu-Zn-Al alloys

Tolley, A. / Condo, A. | British Library Online Contents | 1999