Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon

Gambetta, F. / Frabboni, S. / Tonini, R. et al. | British Library Online Contents | 2000

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. et al. | British Library Online Contents | 2000

A large angle convergent beam electron diffraction study of the core nature of dislocations in 3C-SiC

Ning, X. J. / Pirouz, P. | British Library Online Contents | 1996

Nanometer scale characterisation of CoSi2 and NiSi induced strain in Si by convergent beam electron diffraction

Benedetti, A. / Bender, H. / Torregiani, C. et al. | British Library Online Contents | 2004

Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction

Armigliato, A. / Balboni, R. / Frabboni, S. et al. | British Library Online Contents | 2001