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Si (001) surface defects after extended high temperature annealing

Barge, D. / Joly, J.P. / Rolland, G. / Pichaud, B.

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Si (001) surface defects after extended high temperature annealing

Barge, D. / Joly, J.P. / Rolland, G. / Pichaud, B.

Si (001) surface defects after extended high temperature annealing

Barge, D. / Joly, J.P. / Rolland, G. / Pichaud, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Si (001) surface defects after extended high temperature annealing

Contributors:

Barge, D. (author) / Joly, J.P. (author) / Rolland, G. (author) / Pichaud, B. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 276 - 281

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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