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High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
High temperature Si(0 0 1) surface defect evolution during extended annealing: experimental results and modelling
Barge, D. (author) / Pichaud, B. (author) / Joly, J. P. (author)
APPLIED SURFACE SCIENCE ; 226 ; 341-346
2004-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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