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Residual stress and damage effect on integrity of ground silicon nitride

MONAHAN, R. W. / ZHANG, B. / YANG, F. / WANG, J. / ZHU, Z.

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Residual stress and damage effect on integrity of ground silicon nitride

MONAHAN, R. W. / ZHANG, B. / YANG, F. / WANG, J. / ZHU, Z.

Residual stress and damage effect on integrity of ground silicon nitride

MONAHAN, R. W. / ZHANG, B. / YANG, F. / WANG, J. / ZHU, Z.

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Order at Subito €

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Document information

Title:

Residual stress and damage effect on integrity of ground silicon nitride

Contributors:

MONAHAN, R. W. (author) / ZHANG, B. (author) / YANG, F. (author) / WANG, J. (author) / ZHU, Z. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 35 ; 1115-1124

Publication date:

2000-01-01

Size:

10 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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