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Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology
Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology
Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology
Popov, V. P. (author) / Antonova, I. V. (author) / Stas, V. F. (author) / Mironova, L. V. (author) / Gutakovskii, A. K. (author) / Spesivtsev, E. V. (author) / Mardegzhov, A. S. (author) / Franznusov, A. A. (author) / Feofanov, G. N. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 73 ; 82 - 86
2000-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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