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    Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy

    New search for: Bhushan, B.
    New search for: Goldade, A. V.

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    Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy

    New search for: Bhushan, B.
    New search for: Goldade, A. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy

    New search for: Bhushan, B.
    New search for: Goldade, A. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Measurements and analysis of surface potential change during wear of single-crystal silicon (100) at ultralow loads using Kelvin probe microscopy

    Contributors:

    Bhushan, B. (author) / Goldade, A. V. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 157 ; 373-381

    Publication date:

    2000-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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