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Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Ellison, D. J. / Lee, B. / Podzorov, V. / Frisbie, C. D.

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Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Ellison, D. J. / Lee, B. / Podzorov, V. / Frisbie, C. D.

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Ellison, D. J. / Lee, B. / Podzorov, V. / Frisbie, C. D.

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Check availability in my library

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Document information

Title:

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

Contributors:

Ellison, D. J. (author) / Lee, B. (author) / Podzorov, V. (author) / Frisbie, C. D. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 23 ; 502-507

Publication date:

2011-01-01

Size:

6 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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