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    Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors

    New search for: Lombardo, S.
    New search for: Crupi, F.
    New search for: Spinella, C.
    New search for: Neri, B.

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    Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors

    New search for: Lombardo, S.
    New search for: Crupi, F.
    New search for: Spinella, C.
    New search for: Neri, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors

    New search for: Lombardo, S.
    New search for: Crupi, F.
    New search for: Spinella, C.
    New search for: Neri, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Transients during pre-breakdown and hard breakdown of thin gate oxides in metal-SiO2-Si capacitors

    Contributors:

    Lombardo, S. (author) / Crupi, F. (author) / Spinella, C. (author) / Neri, B. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 2 ; 359-367

    Publication date:

    1999-01-01

    Size:

    9 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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