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Dynamic Avalanche and Trapped Charge in 4H-SiC Diodes

Domeij, M. / Breitholtz, B. / Aberg, D. / Martinez, A. / Bergman, P.

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Dynamic Avalanche and Trapped Charge in 4H-SiC Diodes

Domeij, M. / Breitholtz, B. / Aberg, D. / Martinez, A. / Bergman, P.

Dynamic Avalanche and Trapped Charge in 4H-SiC Diodes

Domeij, M. / Breitholtz, B. / Aberg, D. / Martinez, A. / Bergman, P.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

Title:

Dynamic Avalanche and Trapped Charge in 4H-SiC Diodes

Contributors:

Domeij, M. (author) / Breitholtz, B. (author) / Aberg, D. (author) / Martinez, A. (author) / Bergman, P. (author)

Published in:

MATERIALS SCIENCE FORUM ; 338/342 ; 1327-1330

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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