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Avalanche Multiplication and Breakdown in 4H-SiC Diodes
Avalanche Multiplication and Breakdown in 4H-SiC Diodes
Avalanche Multiplication and Breakdown in 4H-SiC Diodes
Ng, B. K. (author) / David, J. P. R. (author) / Massey, D. J. (author) / Tozer, R. C. (author) / Rees, G. J. (author) / Yan, F. (author) / Zhao, J. H. (author) / Weiner, M. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 1069-1072
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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