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Characterization of Silicon Carbide using Raman Spectroscopy

Burton, J. C. / Long, F. H. / Khlebnikov, Y. / Khlebnikov, I. / Parker, M. / Sudarshan, T. S.

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Characterization of Silicon Carbide using Raman Spectroscopy

Burton, J. C. / Long, F. H. / Khlebnikov, Y. / Khlebnikov, I. / Parker, M. / Sudarshan, T. S.

Characterization of Silicon Carbide using Raman Spectroscopy

Burton, J. C. / Long, F. H. / Khlebnikov, Y. / Khlebnikov, I. / Parker, M. / Sudarshan, T. S.

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Document information

Title:

Characterization of Silicon Carbide using Raman Spectroscopy

Contributors:

Burton, J. C. (author) / Long, F. H. (author) / Khlebnikov, Y. (author) / Khlebnikov, I. (author) / Parker, M. (author) / Sudarshan, T. S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 338/342 ; 615-618

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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