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Characterization of Silicon Carbide using Raman Spectroscopy
Characterization of Silicon Carbide using Raman Spectroscopy
Characterization of Silicon Carbide using Raman Spectroscopy
Burton, J. C. (author) / Long, F. H. (author) / Khlebnikov, Y. (author) / Khlebnikov, I. (author) / Parker, M. (author) / Sudarshan, T. S. (author)
MATERIALS SCIENCE FORUM ; 338/342 ; 615-618
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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