Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of Silicon Carbide using Raman Spectroscopy

    New search for: Burton, J. C.
    New search for: Long, F. H.
    New search for: Khlebnikov, Y.
    New search for: Khlebnikov, I.
    New search for: Parker, M.
    New search for: Sudarshan, T. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of Silicon Carbide using Raman Spectroscopy

    New search for: Burton, J. C.
    New search for: Long, F. H.
    New search for: Khlebnikov, Y.
    New search for: Khlebnikov, I.
    New search for: Parker, M.
    New search for: Sudarshan, T. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Silicon Carbide using Raman Spectroscopy

    New search for: Burton, J. C.
    New search for: Long, F. H.
    New search for: Khlebnikov, Y.
    New search for: Khlebnikov, I.
    New search for: Parker, M.
    New search for: Sudarshan, T. S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of Silicon Carbide using Raman Spectroscopy

    Contributors:

    Burton, J. C. (author) / Long, F. H. (author) / Khlebnikov, Y. (author) / Khlebnikov, I. (author) / Parker, M. (author) / Sudarshan, T. S. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 615-618

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Photoluminescence and Raman Spectroscopy Characterization of Boron- and Nitrogen-Doped 6H Silicon Carbide

    Ou, Y.Y. / Jokubavicius, V. / Liu, C. et al. | British Library Online Contents | 2012

    Graphene Layers on Silicon Carbide Studied by Raman Spectroscopy

    Rohrl, J. / Hundhausen, M. / Emtsev, K.V. et al. | British Library Online Contents | 2009

    Analysis of Microstructure of Silicon Carbide Fiber by Raman Spectroscopy

    Jin, B. / Shi, N. | British Library Online Contents | 2008

    Backside Monitoring of Graphene on Silicon Carbide by Raman Spectroscopy

    Fromm, F. / Hundhausen, M. / Kaiser, M. et al. | British Library Online Contents | 2014

    Study of Indentation Damage in Single Crystal Silicon Carbide by Using Micro Raman Spectroscopy

    Yamaguchi, M. / Fujitsuka, M. / Ueno, S. et al. | British Library Online Contents | 2010

    Back to top