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MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Chafai, M. / Jimenez, J. / Martin, E. / Mitchel, W. C. / Saxler, A. / Perrin, R.

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MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Chafai, M. / Jimenez, J. / Martin, E. / Mitchel, W. C. / Saxler, A. / Perrin, R.

MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Chafai, M. / Jimenez, J. / Martin, E. / Mitchel, W. C. / Saxler, A. / Perrin, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

Contributors:

Chafai, M. (author) / Jimenez, J. (author) / Martin, E. (author) / Mitchel, W. C. (author) / Saxler, A. (author) / Perrin, R. (author)

Published in:

MATERIALS SCIENCE FORUM ; 338/342 ; 707-710

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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