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    Study of the Dislocation Atmospheres in N-type GaAs by DSL Photoetching, EBIC and Microraman Measurements

    New search for: Martin, P.
    New search for: Jimenez, J.
    New search for: Frigeri, C.
    New search for: Weyher, J.
    New search for: Sonnenberg, K.

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    Study of the Dislocation Atmospheres in N-type GaAs by DSL Photoetching, EBIC and Microraman Measurements

    New search for: Martin, P.
    New search for: Jimenez, J.
    New search for: Frigeri, C.
    New search for: Weyher, J.
    New search for: Sonnenberg, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Study of the Dislocation Atmospheres in N-type GaAs by DSL Photoetching, EBIC and Microraman Measurements

    New search for: Martin, P.
    New search for: Jimenez, J.
    New search for: Frigeri, C.
    New search for: Weyher, J.
    New search for: Sonnenberg, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Study of the Dislocation Atmospheres in N-type GaAs by DSL Photoetching, EBIC and Microraman Measurements

    Contributors:

    Martin, P. (author) / Jimenez, J. (author) / Frigeri, C. (author) / Weyher, J. (author) / Sonnenberg, K. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 1791-1796

    Publication date:

    1995-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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