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    Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study

    New search for: Chaudhuri, J.
    New search for: Ignatiev, K.
    New search for: Edgar, J. H.
    New search for: Xie, Z. Y.
    New search for: Gao, Y.
    New search for: Rek, Z.

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    Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study

    New search for: Chaudhuri, J.
    New search for: Ignatiev, K.
    New search for: Edgar, J. H.
    New search for: Xie, Z. Y.
    New search for: Gao, Y.
    New search for: Rek, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study

    New search for: Chaudhuri, J.
    New search for: Ignatiev, K.
    New search for: Edgar, J. H.
    New search for: Xie, Z. Y.
    New search for: Gao, Y.
    New search for: Rek, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Low temperature chemical vapor deposition of 3C-SiC on 6H-SiC - high resolution X-ray diffractometry and synchrotron X-ray topography study

    Contributors:

    Chaudhuri, J. (author) / Ignatiev, K. (author) / Edgar, J. H. (author) / Xie, Z. Y. (author) / Gao, Y. (author) / Rek, Z. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 76 ; 217 - 224

    Publication date:

    2000-01-01

    Size:

    8 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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