Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy: Fid-Bau Portal

Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy

Ramdani, J. / Droopad, R. / Yu, Z. / Curless, J. A. / Overgaard, C. D. / Finder, J. / Eisenbeiser, K. / Hallmark, J. A. / Ooms, W. J. / Kaushik, V.

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Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy

Ramdani, J. / Droopad, R. / Yu, Z. / Curless, J. A. / Overgaard, C. D. / Finder, J. / Eisenbeiser, K. / Hallmark, J. A. / Ooms, W. J. / Kaushik, V.

Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy

Ramdani, J. / Droopad, R. / Yu, Z. / Curless, J. A. / Overgaard, C. D. / Finder, J. / Eisenbeiser, K. / Hallmark, J. A. / Ooms, W. J. / Kaushik, V.

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Document information

Title:

Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy

Contributors:

Ramdani, J. (author) / Droopad, R. (author) / Yu, Z. (author) / Curless, J. A. (author) / Overgaard, C. D. (author) / Finder, J. (author) / Eisenbeiser, K. (author) / Hallmark, J. A. (author) / Ooms, W. J. (author) / Kaushik, V. (author)

Published in:

APPLIED SURFACE SCIENCE ; 159-160 ; 127-133

Publication date:

2000-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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