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Structural evolution and valence electron-state change during ultra thin silicon-oxide growth

Shimizu, A. / Abe, S. / Nakayama, H. / Nishino, T. / Iida, S.

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Structural evolution and valence electron-state change during ultra thin silicon-oxide growth

Shimizu, A. / Abe, S. / Nakayama, H. / Nishino, T. / Iida, S.

Structural evolution and valence electron-state change during ultra thin silicon-oxide growth

Shimizu, A. / Abe, S. / Nakayama, H. / Nishino, T. / Iida, S.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural evolution and valence electron-state change during ultra thin silicon-oxide growth

Contributors:

Shimizu, A. (author) / Abe, S. (author) / Nakayama, H. (author) / Nishino, T. (author) / Iida, S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 159-160 ; 89-97

Publication date:

2000-01-01

Size:

9 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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