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    XPS and HRTEM characterization of cobalt-nickel silicide thin films

    New search for: Garcendez, M.
    New search for: Castillon, F. F.
    New search for: Hirata, G. A.
    New search for: Farias, M. H.
    New search for: Beamson, G.

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    XPS and HRTEM characterization of cobalt-nickel silicide thin films

    New search for: Garcendez, M.
    New search for: Castillon, F. F.
    New search for: Hirata, G. A.
    New search for: Farias, M. H.
    New search for: Beamson, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    XPS and HRTEM characterization of cobalt-nickel silicide thin films

    New search for: Garcendez, M.
    New search for: Castillon, F. F.
    New search for: Hirata, G. A.
    New search for: Farias, M. H.
    New search for: Beamson, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    XPS and HRTEM characterization of cobalt-nickel silicide thin films

    Contributors:

    Garcendez, M. (author) / Castillon, F. F. (author) / Hirata, G. A. (author) / Farias, M. H. (author) / Beamson, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 161 ; 61-73

    Publication date:

    2000-01-01

    Size:

    13 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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