A platform for research: civil engineering, architecture and urbanism
Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons
Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons
Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons
Pronin, I. I. (author) / Valdaitsev, D. A. (author) / Faradzhev, N. S. (author) / Gomoyunova, M. V. (author) / Luches, P. (author) / Valeri, S. (author)
APPLIED SURFACE SCIENCE ; 175-176 ; 83-89
2001-01-01
7 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Oxidation behavior of cobalt silicide and cobalt germanide thin films
British Library Online Contents | 1997
|XPS and HRTEM characterization of cobalt-nickel silicide thin films
British Library Online Contents | 2000
|Atomic Structure Analysis of Ultra Thin Iron Silicide Films by Stereo Atomscope
British Library Online Contents | 2006
|Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy
British Library Online Contents | 2017
|Acoustic Emission and Destruction of Inelastically Strained Metal
British Library Online Contents | 2004
|