Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy: Fid-Bau Portal

Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy

Lelarge, F. / Priester, C. / Constantin, C. / Rudra, A. / Leifer, K. / Kapon, E.

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Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy

Lelarge, F. / Priester, C. / Constantin, C. / Rudra, A. / Leifer, K. / Kapon, E.

Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy

Lelarge, F. / Priester, C. / Constantin, C. / Rudra, A. / Leifer, K. / Kapon, E.

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Check availability in my library

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Document information

Title:

Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy

Contributors:

Lelarge, F. (author) / Priester, C. (author) / Constantin, C. (author) / Rudra, A. (author) / Leifer, K. (author) / Kapon, E. (author)

Published in:

APPLIED SURFACE SCIENCE ; 166 ; 290-294

Publication date:

2000-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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