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    Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction

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    New search for: Wu, T.-B.

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    Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction

    New search for: Lee, H.-Y.
    New search for: Wu, T.-B.

    Access

    Access via TIB
    Check availability in my library
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    Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction

    New search for: Lee, H.-Y.
    New search for: Wu, T.-B.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Structural characterization of sputter-deposited LaNiO~3 thin films on Si substrate by x-ray reflectivity and diffraction

    Contributors:

    Lee, H.-Y. (author) / Wu, T.-B. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 3165-3173

    Publication date:

    1997-01-01

    Size:

    9 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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