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    Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods

    New search for: Szilagyi, E.
    New search for: Khanh, N. Q.
    New search for: Horvath, Z. E.
    New search for: Lohner, T.
    New search for: Battistig, G.
    New search for: Zolnai, Z.
    New search for: Kotai, E.
    New search for: Gyulai, J.

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    Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods

    New search for: Szilagyi, E.
    New search for: Khanh, N. Q.
    New search for: Horvath, Z. E.
    New search for: Lohner, T.
    New search for: Battistig, G.
    New search for: Zolnai, Z.
    New search for: Kotai, E.
    New search for: Gyulai, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods

    New search for: Szilagyi, E.
    New search for: Khanh, N. Q.
    New search for: Horvath, Z. E.
    New search for: Lohner, T.
    New search for: Battistig, G.
    New search for: Zolnai, Z.
    New search for: Kotai, E.
    New search for: Gyulai, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods

    Contributors:

    Szilagyi, E. (author) / Khanh, N. Q. (author) / Horvath, Z. E. (author) / Lohner, T. (author) / Battistig, G. (author) / Zolnai, Z. (author) / Kotai, E. (author) / Gyulai, J. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 353/356 ; 271-274

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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