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    Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

    New search for: Kim, J. H.
    New search for: Kim, H. R.
    New search for: Park, H. H.
    New search for: Hyun, S. H.

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    Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

    New search for: Kim, J. H.
    New search for: Kim, H. R.
    New search for: Park, H. H.
    New search for: Hyun, S. H.

    Access

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    Check availability in my library
    Order at Subito €

    Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

    New search for: Kim, J. H.
    New search for: Kim, H. R.
    New search for: Park, H. H.
    New search for: Hyun, S. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

    Contributors:

    Kim, J. H. (author) / Kim, H. R. (author) / Park, H. H. (author) / Hyun, S. H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 169-170 ; 452-456

    Publication date:

    2001-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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