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HREM study of basal stacking faults in GaN layers grown over sapphire substrate
HREM study of basal stacking faults in GaN layers grown over sapphire substrate
HREM study of basal stacking faults in GaN layers grown over sapphire substrate
Potin, V. (author) / Gil, B. (author) / Charar, S. (author) / Ruterana, P. (author) / Nouet, G. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 82 ; 114 - 116
2001-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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