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Impedance spectroscopic analysis of forward biased metal oxide semiconductor tunnel diodes (MOSTD)
Impedance spectroscopic analysis of forward biased metal oxide semiconductor tunnel diodes (MOSTD)
Impedance spectroscopic analysis of forward biased metal oxide semiconductor tunnel diodes (MOSTD)
Matsumura, M. (author) / Hirose, Y. (author)
APPLIED SURFACE SCIENCE ; 175-176 ; 740-745
2001-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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