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    Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy

    New search for: Srnanek, R.
    New search for: Kinder, R.
    New search for: Sciana, B.
    New search for: Radziewicz, D.
    New search for: McPhail, D. S.
    New search for: Littlewood, S. D.
    New search for: Novotny, I.

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    Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy

    New search for: Srnanek, R.
    New search for: Kinder, R.
    New search for: Sciana, B.
    New search for: Radziewicz, D.
    New search for: McPhail, D. S.
    New search for: Littlewood, S. D.
    New search for: Novotny, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy

    New search for: Srnanek, R.
    New search for: Kinder, R.
    New search for: Sciana, B.
    New search for: Radziewicz, D.
    New search for: McPhail, D. S.
    New search for: Littlewood, S. D.
    New search for: Novotny, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy

    Contributors:

    Srnanek, R. (author) / Kinder, R. (author) / Sciana, B. (author) / Radziewicz, D. (author) / McPhail, D. S. (author) / Littlewood, S. D. (author) / Novotny, I. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 177 ; 139-145

    Publication date:

    2001-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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