Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques: Fid-Bau Portal

Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques

Rivera, A. / Montilla, I. / Garcia, A. A. / Galindo, R. E. / Falub, C. V. / van Veen, A. / Schut, H. / de Nijs, J. M. M. / Balk, P.

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Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques

Rivera, A. / Montilla, I. / Garcia, A. A. / Galindo, R. E. / Falub, C. V. / van Veen, A. / Schut, H. / de Nijs, J. M. M. / Balk, P.

Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques

Rivera, A. / Montilla, I. / Garcia, A. A. / Galindo, R. E. / Falub, C. V. / van Veen, A. / Schut, H. / de Nijs, J. M. M. / Balk, P.

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Document information

Title:

Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques

Contributors:

Rivera, A. (author) / Montilla, I. (author) / Garcia, A. A. (author) / Galindo, R. E. (author) / Falub, C. V. (author) / van Veen, A. (author) / Schut, H. (author) / de Nijs, J. M. M. (author) / Balk, P. (author)

Published in:

MATERIALS SCIENCE FORUM ; 363/365 ; 64-66

Publication date:

2001-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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