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Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)
Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)
Interface Defects of Al/GaAs(100) Detected by Positron Annihilation Induced Auger Electron Spectroscopy (PAES)
Chen, W.-C. (author) / Fazleev, N. G. (author) / Fry, J. L. (author) / Weiss, A. H. (author)
MATERIALS SCIENCE FORUM ; 363/365 ; 621-623
2001-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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Positron Annihilation Induced Auger Electron Spectroscopy (PAES)
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