A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Contact-less electrical defect characterisation of silicon by MD-PICTS
Contact-less electrical defect characterisation of silicon by MD-PICTS
Contact-less electrical defect characterisation of silicon by MD-PICTS
Dornich, K. (author) / Niemietz, K. (author) / Wagner, M. (author) / Niklas, J. R. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 241-245
2006-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Contact-Less Electrical Defect Characterization of Semi-Insulating 6H-SiC Bulk Material
| British Library Online Contents | 2009
| British Library Online Contents | 2001
Photoluminescence topography, PICTS and microwave conductivity investigation of EL6 in GaAs
| British Library Online Contents | 2002
On‐Demand, Contact‐Less and Loss‐Less Droplet Manipulation via Contact Electrification
| Wiley | 2024
On‐Demand, Contact‐Less and Loss‐Less Droplet Manipulation via Contact Electrification
| Wiley | 2024