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    Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS

    New search for: Hodoroaba, V. D.
    New search for: Unger, W. E.
    New search for: Jenett, H.
    New search for: Hoffmann, V.
    New search for: Hagenhoff, B.
    New search for: Kayser, S.
    New search for: Wetzig, K.

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    Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS

    New search for: Hodoroaba, V. D.
    New search for: Unger, W. E.
    New search for: Jenett, H.
    New search for: Hoffmann, V.
    New search for: Hagenhoff, B.
    New search for: Kayser, S.
    New search for: Wetzig, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS

    New search for: Hodoroaba, V. D.
    New search for: Unger, W. E.
    New search for: Jenett, H.
    New search for: Hoffmann, V.
    New search for: Hagenhoff, B.
    New search for: Kayser, S.
    New search for: Wetzig, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS

    Contributors:

    Hodoroaba, V. D. (author) / Unger, W. E. (author) / Jenett, H. (author) / Hoffmann, V. (author) / Hagenhoff, B. (author) / Kayser, S. (author) / Wetzig, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 179 ; 30-38

    Publication date:

    2001-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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