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Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Rubanov, S. / Munroe, P. R.

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Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Rubanov, S. / Munroe, P. R.

Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Rubanov, S. / Munroe, P. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Contributors:

Rubanov, S. (author) / Munroe, P. R. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 20 ; 1181-1184

Publication date:

2001-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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